Supply source

  • 07-Apr-2011 04:45 EDT
TES-A-2175.jpg

The VAR 3005 dual-voltage supply source from Teseq offers two power sources in one unit. Controlled by the company's NSG 3000 test generators, the supply source regulates test voltage and generates the reduced variable voltage for dips and drops of equipment under test (EUT). The VAR 3005 features internal microprocessor-based electronics, self-regulation, and self-test features including power volt and phase rotation check. The unit generates dips, drops, and variation tests for equipment with a current rating below 16 A. EUT supply input voltage range is from 10 to 240 V ac. Based on plug-and-play technology, the VAR 3005 auto-configures tests to prevent errors, can inform users if conditions are not correct, and can turn off the EUT during a power overload. A single source model also is available.

Share
HTML for Linking to Page
Page URL
Grade
Rate It
0.00 Avg. Rating

Read More Articles On

2016-08-26
The push toward miniaturization in the electronics industry has left designers little or no room for test points, and the expansion of high frequency technologies has resulted in a growing need for test equipment that has the capability to verify these types of very small circuits.
2016-08-26
dSPACE and BTC Embedded Systems offer a solution that improves test depth for the real-time validation of safety-critical applications with extension of classical test methods, easier compliance with safety standards and optimal integration and cross-platform use.
2016-08-26
CNH Industrial and AVL researchers used simulation, test bench, and road testing of a demonstrator vehicle with a WHR system to show significantly reduced fuel consumption.
2016-12-07
Christopher Grundler, the Director of OTAQ for the U.S. EPA, answered questions about Phase 2 rule-making for heavy trucks, global harmonization of emissions regulations, and his outlook for a new national NOx standard. Grundler will be the featured speaker on opening day of the SAE 2017 Government/Industry Meeting taking place January 25-27 in Washington D.C.

Related Items

Technical Paper / Journal Article
2011-04-12
Training / Education
2017-08-16
Training / Education
2013-04-09
Article
2016-08-26
Training / Education
2011-04-12
Standard
2014-07-09