Electronics testing tool

  • 31-Jan-2011 04:03 EST

Saelig’s GP-24116 and 24132 combine a high-speed digital pattern generator, logic analyzer, and bidirectional protocol (SPI/I2C) host adapter with either 16 MB or 32 MB of internal memory. The devices offer high-speed programmable bidirectional interfaces that allow the stimulation and analysis of digital electronic systems and ICs, providing access to electronic devices under test. The expandable PC-based tools complement existing system debug equipment such as logic analyzers and high-speed oscilloscopes. The system can be used as an arbitrary digital pattern generator, logic analyzer, or serial protocol master / analyzer, with 16 address/data lines and six control lines, offering up to 100 MHz (200 MB/s burst) performance. While theoretical continuous throughput is 48 MB/s, actual throughput for continuous transfer is between 11 MB/s and 30 MB/s, depending on the host PC's performance. The unit provides designers with a stimulus source for applications including digital and mixed-signal ASIC, FPGA, microprocessors, and microcontrollers.

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