Calibration software

  • 01-Mar-2010 04:59 EST

Wika’s CPG-1000 data logging software is suitable for applications requiring evaluation of pressure data represented graphically over a period of time such as leak testing, pressure safety valve testing, wellhead monitoring, and chart record testing and replacement. With the software, users can configure how pressure readings are captured. Data runs can be configured from a few seconds to several weeks, and the data captured can be continuously logged every second or as infrequently as once an hour. The logger also can be set to capture preset rising or falling points, noise, and transients in the pressure signal. Features include accuracy of 0.05%, temperature compensation from 32 to 122°F (0 to 50°C), and a backlit 5.5-in display. Data can be manipulated to show averages, minimum, maximum, and median process pressures, while the log can record up to 9520 data points.

HTML for Linking to Page
Page URL
Rate It
0.00 Avg. Rating

Read More Articles On

Christopher Grundler, the Director of OTAQ for the U.S. EPA, answered questions about Phase 2 rule-making for heavy trucks, global harmonization of emissions regulations, and his outlook for a new national NOx standard. Grundler will be the featured speaker on opening day of the SAE 2017 Government/Industry Meeting taking place January 25-27 in Washington D.C.
Making off-highway equipment, such as construction or agriculture machines, more efficient continues to be a priority after the final phase-in of the U.S. EPA Tier 4 Final emissions regulations. “Some of the companies we work with are running out of credits and unfortunately still struggling with Tier 4,” explained Tristan Donley, Technical Director, Off-Highway Heavy Vehicles North American for Exa, a supplier of software for computational fluid dynamics (CFD).
With the new SCALEXIO LabBox, dSPACE offers a compact high-performance system for hardware-in-the-loop tests.
The MTEK Subsystem (Marvin Test Expansion Kit) from Marvin Test Solutions (MTS), Inc. adds test capabilities to legacy semiconductor test systems that lack the ability to meet the test requirements of current devices.

Related Items

Training / Education
Technical Paper / Journal Article
Training / Education
Training / Education
Technical Paper / Journal Article
Training / Education