Legacy semiconductor test systems

  • 06-Sep-2017 01:33 EDT
MTEK.jpg

The MTEK Subsystem (Marvin Test Expansion Kit) from Marvin Test Solutions (MTS), Inc. (Irvine, CA) adds test capabilities to legacy semiconductor test systems that lack the ability to meet the test requirements of current devices. Based on MTS’ portfolio of PXI/PXIe chassis and instrumentation as well as selections from other industry suppliers, the company says MTEK allows customers to configure a subsystem with exactly the resources needed to deliver the capabilities lacking in their current legacy ATE. The compact MTEK is an easy-to-integrate, open architecture plug-and-play solution that cost-effectively adds RF, high-performance digital, and/or high-performance analog capabilities. MTEK is compatible with multiple legacy semiconductor test platforms, including Teradyne, LTX/Credence, Eagle, ASL100, Sentry and Verigy. According to MTS, MTEK is easily expandable in the field and is designed to support both engineering and production environments.

Share
HTML for Linking to Page
Page URL
Grade
Rate It
0.00 Avg. Rating

Read More Articles On

2016-12-07
Christopher Grundler, the Director of OTAQ for the U.S. EPA, answered questions about Phase 2 rule-making for heavy trucks, global harmonization of emissions regulations, and his outlook for a new national NOx standard. Grundler will be the featured speaker on opening day of the SAE 2017 Government/Industry Meeting taking place January 25-27 in Washington D.C.
2017-03-03
Making off-highway equipment, such as construction or agriculture machines, more efficient continues to be a priority after the final phase-in of the U.S. EPA Tier 4 Final emissions regulations. “Some of the companies we work with are running out of credits and unfortunately still struggling with Tier 4,” explained Tristan Donley, Technical Director, Off-Highway Heavy Vehicles North American for Exa, a supplier of software for computational fluid dynamics (CFD).
2017-01-03
With the new SCALEXIO LabBox, dSPACE offers a compact high-performance system for hardware-in-the-loop tests.
2017-08-03
Engineers are adding sensors, more powerful micros and faster networks as they automate tasks and pave the way to autonomy.

Related Items

Training / Education
2018-03-12
Technical Paper / Journal Article
2010-10-05
Training / Education
2013-02-20
Training / Education
2013-04-09
Article
2017-03-13
Technical Paper / Journal Article
2011-04-12
Technical Paper / Journal Article
2011-04-12