Data acquisition system

  • 01-Oct-2012 07:45 EDT
Kistler_KiDauAdvanced.jpg

Kistler’s Type K3880A KiDAU Advanced onboard data acquisition system was designed to surpass various passenger and military vehicle crash test, legislative, and safety and vehicle dynamics testing requirements. Compatible with Kistler crash data acquisition systems, KiDAU Advanced captures and stores test data before a vehicle or sled test is started to ensure complete system functionality and data preservation from the event trigger point. The system allows more than 8 min recording time and features up to 20 mA constant current excitation and high signal bandwidth. Adjustments are software implemented automatically or by command. Design of the Type K3880A includes 32 analog and 16 digital inputs, as well as a single CAN bus logging channel in a box measuring 231 x 64 x 70.5 mm (9.1 x 2.5 x 2.8 in).

Share
HTML for Linking to Page
Page URL
Grade
Rate It
5.00 Avg. Rating

Read More Articles On

2016-12-07
Christopher Grundler, the Director of OTAQ for the U.S. EPA, answered questions about Phase 2 rule-making for heavy trucks, global harmonization of emissions regulations, and his outlook for a new national NOx standard. Grundler will be the featured speaker on opening day of the SAE 2017 Government/Industry Meeting taking place January 25-27 in Washington D.C.
2017-03-03
Making off-highway equipment, such as construction or agriculture machines, more efficient continues to be a priority after the final phase-in of the U.S. EPA Tier 4 Final emissions regulations. “Some of the companies we work with are running out of credits and unfortunately still struggling with Tier 4,” explained Tristan Donley, Technical Director, Off-Highway Heavy Vehicles North American for Exa, a supplier of software for computational fluid dynamics (CFD).
2017-01-03
With the new SCALEXIO LabBox, dSPACE offers a compact high-performance system for hardware-in-the-loop tests.
2017-09-06
The MTEK Subsystem (Marvin Test Expansion Kit) from Marvin Test Solutions (MTS), Inc. adds test capabilities to legacy semiconductor test systems that lack the ability to meet the test requirements of current devices.

Related Items

Technical Paper / Journal Article
2011-04-12
Training / Education
2010-07-07
Training / Education
2005-08-26
Technical Paper / Journal Article
2013-05-13
Standard
2014-07-09
Technical Paper / Journal Article
2011-04-12
Training / Education
2013-04-09
Training / Education
2013-02-20