Embedded controller

  • 03-Apr-2012 02:36 EDT
National Inst 030512_PXIe-8115_PressImage.jpg

 

National Instruments' NI PXIe-8115 embedded controller features a dual-core second-generation Intel i5 processor to reduce test times and turbo boost technology to increase the clock frequency based on application type. Suitable for multicore applications, the controller reduces the need for software to be multithreaded to use the latest CPU developments. The flexibility to operate in dual-core or high-performance single-core mode makes the controller suitable for applications including automated test and industrial control. A set of peripheral I/O ports with six USB 2.0 docks minimize the need for external adapters and enable hybrid systems. In-ROM and hard drive diagnostics improve serviceability and minimize downtime. By combining the controller with NI LabVIEW system design software, engineers can improve efficiency in various test, measurement, and control applications.

Share
HTML for Linking to Page
Page URL
Grade
Rate It
0.00 Avg. Rating

Read More Articles On

2016-08-26
The push toward miniaturization in the electronics industry has left designers little or no room for test points, and the expansion of high frequency technologies has resulted in a growing need for test equipment that has the capability to verify these types of very small circuits.
2016-08-26
dSPACE and BTC Embedded Systems offer a solution that improves test depth for the real-time validation of safety-critical applications with extension of classical test methods, easier compliance with safety standards and optimal integration and cross-platform use.
2016-08-26
CNH Industrial and AVL researchers used simulation, test bench, and road testing of a demonstrator vehicle with a WHR system to show significantly reduced fuel consumption.
2016-12-07
Christopher Grundler, the Director of OTAQ for the U.S. EPA, answered questions about Phase 2 rule-making for heavy trucks, global harmonization of emissions regulations, and his outlook for a new national NOx standard. Grundler will be the featured speaker on opening day of the SAE 2017 Government/Industry Meeting taking place January 25-27 in Washington D.C.

Related Items

Article
2016-08-26
Technical Paper / Journal Article
2011-04-12
Video
2017-03-26
Technical Paper / Journal Article
2010-10-05