Atomic force microscopy device

  • 11-Nov-2011 02:43 EST
AppliedFieldSeries.jpg

Asylum Research’s Variable Field Module 2 for MFP-3D atomic force microscopes assists researchers who want to apply magnetic fields to their atomic force microscopy (AFM) experiments and applies continuously adjustable magnetic fields parallel to the sample plane approaching one Tesla with one Gauss resolution. The module is useful for magnetic force microscopy (MFM), conductive AFM (C-AFM), and other applications where the sample's properties are magnetic field dependent. The unit attaches to the microscope and features adjustable pole tips for optimal choice between maximum required field, sample placement, and minimum field gradients. Field intensity is software controllable.

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